Interferometer and method for measuring the refractive index and optical path length effects of air
US6525825B2 · kind B2 · utility
26Cited by
7References
2Claims
0Family size
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Key dates
| Filing date | Mar 12, 2002 |
| Grant date | Feb 25, 2003 |
| Priority date | — |
| Expiry date | Mar 12, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. Apparatus and method for measuring effects of the refractive index of a gas in a measurement path wherein the phase redundancy is resolved for phase signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.