Multiple axis magnetic test for open integrated circuit pins
US6529019B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2000 |
| Grant date | Mar 4, 2003 |
| Priority date | — |
| Expiry date | Dec 1, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/54
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure relates to a method and apparatus for determining the electrical continuity of an element of an electrical component, for example, a pin of a printed circuit assembly. The method comprises the steps of supplying an electrical stimulus to the element of the electrical component, positioning a sensor adjacent the element of the electrical component, the sensor having multiple axes along which the sensor is responsive to magnetic fields, receiving magnetic field signals created by the element of the electrical component with the sensor, producing electrical signals indicative of the magnetic field strength sensed by the sensor in multiple directions that correspond to the multiple axes, and comparing the electrical signals with predetermined limits associated with the element being tested. In a preferred arrangement, the sensor is provided with three axes which are oriented in orthogonal directions such that the magnetic signals from the element can be detected in three dimensional space.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.