Inventor · Loveland, CO, US

John E. McDermid

19Patents
8h-index
17Co-inventors
69Inventor score

Filing activity: Dec 12, 1983 → Dec 14, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US5274336A Capacitively-coupled test probe Physics 151 Expired
US5469064A Electrical assembly testing using robotic positioning of probes Physics 52 Expired
US6087842A Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry Electricity 39 Expired
US6097203A Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry Electricity 36 Expired
US5968191A Method and apparatus for testing integrated circuits in a mixed-signal environment Physics 32 Expired
US6263476A Method and apparatus for selecting targeted components in limited access test Physics 27 Expired
US6327545A Method and apparatus for board model correction Physics 19 Expired
US6334100A Method and apparatus for electronic circuit model correction Physics 8 Expired
US7474105B2 Soil moisture sensor systems and methods Physics 7 Active
US4563636A Connection verification between circuit board and circuit tester Physics 7 Expired
US6266787A Method and apparatus for selecting stimulus locations during limited access circuit test Physics 7 Expired
US6876214B2 Method and apparatus for configurable hardware augmented program generation Physics 6 Expired
US6529019B1 Multiple axis magnetic test for open integrated circuit pins Physics 6 Expired
US6636061B1 Method and apparatus for configurable hardware augmented program generation Physics 5 Expired
US6467051B1 Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test Physics 3 Expired
US6925398B2 Water measurement apparatus and methods Physics 2 Expired
US7324901B2 Water measurement auto-networks Physics 1 Expired
US6233706A Method and apparatus for limited access circuit test Physics 1 Expired
US6237118A Method and apparatus for correcting for detector inaccuracies in limited access testing Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.