Patent · US Expired

Magnetoresistance random access memory for improved scalability

US6531723B1 · kind B1 · utility

31Cited by
2References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 16, 2001
Grant dateMar 11, 2003
Priority date
Expiry dateOct 16, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N50/10
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A scalable magnetoresistive tunneling junction memory cell comprising a fixed ferromagnetic region having a magnetic moment vector fixed in a preferred direction in the absence of an applied magnetic field, an electrically insulating material positioned on the fixed ferromagnetic region to form a magnetoresistive tunneling junction, and a free ferromagnetic region having a magnetic moment vector oriented in a position parallel or anti-parallel to that of the fixed ferromagnetic region. The free ferromagnetic region includes N ferromagnetic layers that are anti-ferromagnetically coupled, where N is an integer greater than or equal to two. The number N of ferromagnetic layers can be adjusted to increase the effective magnetic switching volume of the MRAM device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.