Patent · US Expired

Cell interconnect delay library for integrated circuit design

US6532576B1 · kind B1 · utility

10Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2001
Grant dateMar 11, 2003
Priority date
Expiry dateJun 14, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for characterizing cell interconnect delay is disclosed that may be included in a library for use with logic design tools. A method of characterizing cell interconnect delay includes the steps of (a) receiving as inputs a plurality of input ramptimes and a plurality of interconnect lengths for a selected cell, and (b) calculating an output ramptime and a total cell delay including a cell delay and an interconnect delay for each of the plurality of input ramptimes for each of the plurality of interconnect lengths for the selected cell from the inputs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.