Patent · US Expired

Two pole coupling noise analysis model for submicron integrated circuit design verification

US6536022B1 · kind B1 · utility

22Cited by
3References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 25, 2000
Grant dateMar 18, 2003
Priority date
Expiry dateFeb 25, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An automated method of analyzing crosstalk in a digital logic integrated circuit, the method operating on a digital computer, is described. The method uses available software to make an extracted, parameterized netlist from a layout of the integrated circuit. For at least one potential victim wire of the plurality of wires, determining a subset of the wires of the chip are found to be potential aggressor wires that may couple to the victim wire. The aggressor wires are combined into a common aggressor. A risetime of the common aggressor is calculated and used to calculate the magnitude of coupled noise on the victim wire induced by the aggressor wires. An alarm threshold for each potential victim wire is determined based upon the type of logic gate that receives the victim wire. The alarm thresholds for each potential victim wire are compared to the calculated height of a coupled noise on the victim wire to determine which, if any, wires of the design suffer enough crosstalk noise that they should be redesigned.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.