Silicon-on-insulator (SOI) trench photodiode
US6538299B1 · kind B1 · utility
33Cited by
6References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 3, 2000 |
| Grant date | Mar 25, 2003 |
| Priority date | — |
| Expiry date | Oct 3, 2020 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P70/50
Abstract
A semiconductor device (and method for forming the device) includes a silicon-on-insulator (SOI) wafer formed on a substrate surface. An isolation trench in the wafer surface surrounds alternating p-type trenches and n-type trenches and electrically isolates the device from the substrate, thereby allowing the device to be effectively utilized as a differential detector in an optoelectronic circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.