Read/write memory with self-test device and associated test method

US6539506B1 · kind B1 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Stefan Lammers · Hersbruck, DE
• Werner Weber · Munich, DE

Key dates

• Filing date: Nov 1, 1999
• Grant date: Mar 25, 2003
• Expiry date: Nov 1, 2019

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C29/44
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A read/write memory includes a monolithically integrated self-test device which iteratively enables a defect test with a redundancy analysis, without significant external test aids. The test is achieved essentially by virtue of the fact that word lines to be repaired are stored and excluded from further examinations and in each case the line having the most defects not previously detected is always determined and examined first, until either the number of repair lines no longer suffices or no more defects occur. An associated test method is also provided.