METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD FOR STORING A TEMPERATURE THRESHOLD IN A DYNAMIC RANDOM ACCESS MEMORY, METHOD OF MODIFYING DYNAMIC RANDOM ACCESS MEMORY OPERATION IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT
US6552945B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2001 |
| Grant date | Apr 22, 2003 |
| Priority date | — |
| Expiry date | May 3, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/4078
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for storing a temperature threshold in an integrated circuit includes measuring operating parameters of the integrated circuit versus temperature, calculating a maximum temperature at which the integrated circuit performance exceeds predetermined specifications and storing parameters corresponding to the maximum temperature in a comparison circuit in the integrated circuit by selectively blowing fusable devices in the comparison circuit. The fusable devices may be antifuses. As a result, the integrated circuit is able to provide signals to devices external to the integrated circuit to indicate that the integrated circuit may be too hot to operate properly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.