Patent · US Expired

Interconnect structure

US6555759B2 · kind B2 · utility

13Cited by
21References
55Claims
0Family size

Inventors

Key dates

Filing dateFeb 21, 2001
Grant dateApr 29, 2003
Priority date
Expiry dateFeb 21, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49213
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An embodiment of the present invention is a method for wafer level IC packaging that includes the steps of: (a) forming compliant, conductive bumps on metalized bond pads or conductors; and (b) surrounding the compliant, conductive bumps in a supporting layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.