Patent · US Expired

Semiconductor device including eutectic bonding portion and method for manufacturing the same

US6555901B1 · kind B1 · utility

310Cited by
8References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 1997
Grant dateApr 29, 2003
Priority date
Expiry dateSep 12, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/16235
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A sensing element is formed on a silicon (Si) substrate and covered with a cap. The cap has a leg portion having a titanium layer and a gold layer formed in that order on the lower surface thereof. The silicon substrate has an Si bonding frame at a position corresponding to the leg portion. When bonding the Si bonding frame of the silicon substrate and the leg portion of the cap, the titanium layer deoxidizes a naturally oxidized silicon layer formed on the Si bonding frame, whereby the silicon substrate and the cap can be uniformly bonded together with an Au/Si eutectic portion interposed therebetween. In this case, the Au/Si eutectic portion includes a titanium oxide accompanying the deoxidization of the naturally oxidized silicon layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.