Patent · US Expired

Integrated photodetector

US6559488B1 · kind B1 · utility

3Cited by
10References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 20, 2001
Grant dateMay 6, 2003
Priority date
Expiry dateApr 20, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/803

Abstract

A photodetector is integrated on a single semiconductor chip with bipolar transistors including a high speed poly-emitter vertical NPN transistor. The photodetector includes a silicon nitride layer serving as an anti-reflective film. The silicon nitride layer and oxide layers on opposite sides thereof insulate edges of a polysilicon emitter from the underlying transistor regions, minimizing the parasitic capacitance between the NPN transistor's emitter and achieving a high frequency response.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.