Patent · US Expired

Semiconductor device manufacturing method having a step of forming a post terminal on a wiring by electroless plating

US6566239B2 · kind B2 · utility

19Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 31, 2001
Grant dateMay 20, 2003
Priority date
Expiry dateMay 31, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/014
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing a semiconductor device is provided. The method includes the steps of forming a wiring layer on an underlying metal film formed on a substrate, the wiring layer being electrically connected to an electrode pad formed on a substrate, removing a part of the wiring layer so as to form a wiring on the substrate, a part of the underlying metal film being exposed other than a part where the wiring is formed, removing the exposed part of the underlying metal film by using the wiring as a mask, forming a barrier metal film on the wiring so as to cover the wiring and the underlying metal film underneath the wiring, forming a post terminal by electroless plating so that the post terminal is electrically connected to said wiring and providing a sealing resin so as to cover said substrate except a position at which said post terminal is formed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.