Patent · US Expired

Investigation device and method

US6566653B1 · kind B1 · utility

16Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2002
Grant dateMay 20, 2003
Priority date
Expiry dateFeb 15, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/852
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An investigation device includes a time of flight mass spectrometer with an entrance opening, and an electrically conductive tip on a cantilever which is movable from a first position near a sample on a sample holder to a second position near the entrance opening. A sample particle is obtained with the tip being in the first position from the sample. The tip, with the particle, is moved into the second position where the particle can be accelerated towards the entrance opening. The particle is analyzable by the time of flight mass spectrometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.