Patent · US Expired

Single level metal memory cell using chalcogenide cladding

US6567293B1 · kind B1 · utility

387Cited by
14References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 2000
Grant dateMay 20, 2003
Priority date
Expiry dateNov 10, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N70/8828
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus including a volume of phase change material disposed between a first conductor and a second conductor on a substrate, and a plurality of electrodes coupled to the volume of phase change material and the first conductor. A method including introducing, over a first conductor on a substrate, a plurality of electrodes coupled to the first conductor, introducing a phase change material over the plurality of electrodes and in electrical communication with the plurality of electrodes, and introducing a second conductor over the phase change material and coupled to the phase change material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.