Electro-optic sampling oscilloscope
US6567760B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 27, 1999 |
| Grant date | May 20, 2003 |
| Priority date | — |
| Expiry date | Apr 27, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/347
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electro-optic sampling oscilloscope (or EOS oscilloscope) uses an electro-optic probe containing an electro-optic crystal, which is placed under effect of an electric field caused by a measured signal. Laser pulses are supplied to the electro-optic crystal wherein they are subjected to polarization. Then, measurement data representative of a waveform of the measured signal are produced in response to polarization states of the laser pulses and are stored in a measurement data storage. A user can select specific measurement data by using a list of files of multiple measurement data which is displayed on a screen. Then, the EOS oscilloscope displays an outline waveform which is created based on a reduced number of sample points extracted from the selected measurement data. Comments and/or measurement conditions can be stored in the measurement data storage in relation to the measurement data, so that they are adequately displayed on the screen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.