Patent · US Expired

Bump bonding apparatus and method

US6568580B2 · kind B2 · utility

5Cited by
19References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 2001
Grant dateMay 27, 2003
Priority date
Expiry dateJul 25, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/53178
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Wafers are previously positioned so that the wafer orientation flat is oriented in a particular direction. A transporting means then moves and places the previously positioned wafer on a bonding stage where bumps are formed on the wafer by means of a bonding head. The transporting means has a sensor for detecting the position of the orientation flat of a wafer on the bonding stage from a position above the bonding stage, thereby avoiding the adverse effects of heat from the bonding stage during orientation flat detection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.