Test probe and separable mating connector assembly
US6570399B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 12, 2001 |
| Grant date | May 27, 2003 |
| Priority date | — |
| Expiry date | Feb 3, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved probe includes a conductive tubular housing or body containing a coil spring and a conductive plunger movable in the housing and having a contact tip outwardly extending from one end of the housing. The plunger and tip are urged to a normally outward position by the bias force of the spring. The opposite end of the housing has an opening for mating with a conductive pin of a connector. The connector is retained in a mounting plate of an associated fixture and has terminal ends of desired configuration. The terminal end may include a wire-wrap pin, a crimp type terminal for attachment to a wire, or the terminal may include a spring loaded pin for engagement with an associated electrical contact. An air tight seal may be provided between the probe and the connector and the connector may be mounted in a mounting such that when vacuum is applied to an associated test fixture, air cannot be drawn through the fixture or through the body of the probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.