Method to improve charge pump reliability, efficiency and size
US6570434B1 · kind B1 · utility
7Cited by
6References
10Claims
0Family size
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Key dates
| Filing date | Sep 15, 2000 |
| Grant date | May 27, 2003 |
| Priority date | — |
| Expiry date | Sep 15, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C5/145
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A dynamic clamp is used in conjunction with capacitors with thinner dielectric or with deep trench capacitors to solve the problem of dielectric breakdown in high stress capacitors. The dynamic clamp is realized using a two stage pump operation cycle such that, during a first stage pump cycle, a middle node of a pair of series connected capacitors is pre-charged to a supply voltage and, during a second stage pump cycle, the middle node is coupled by a boost clock. Thus, at any moment in the pump operation cycle, the voltage across the capacitors is held within a safety range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.