In situ optical surface temperature measuring techniques and devices

US6572265B1 · kind B1 · utility

Assignee

• Luxtron Corporation · US

Inventors

• John P. Gotthold · Sunnyvale, US
• Anh Hoang · Santa Clara, US
• Surinder S. Sandhu · Dormagen, DE
• John Leonard Shaver · San Francisco, US
• Terry M. Stapleton · San Jose, US

Key dates

• Filing date: Apr 20, 2001
• Grant date: Jun 3, 2003
• Expiry date: May 12, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J5/046
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A temperature sensor utilizing optical temperature measuring techniques is constructed to make firm contact with a surface whose temperature is being measured, an example application being the monitoring of semiconductor wafers or flat panel displays while being processed. A cap is mounted near but spaced apart from an end of a lightwave guide, with a resilient element that applies force of the cap against a surface whose temperature is being measured as the cap is urged toward the optical fiber end. An optical temperature sensing element, such as luminescent material or a surface of known emissivity, is carried within the cap. A bellows with a closed end conveniently serves as both the cap and the resilient element. An alternative temperature measuring device installs an optical temperature sensing material within a test substrate behind an optical window, and then views the sensing material through the window.