Patent · US Expired

Semiconductor device

US6573586B2 · kind B2 · utility

18Cited by
1References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 25, 2002
Grant dateJun 3, 2003
Priority date
Expiry dateFeb 25, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/1659
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Disclosed are a fast, highly-integrated and highly-reliable magnetoresistive random access memory (MRAM) and a semiconductor device which uses the MRAM. The semiconductor device performs the read-out operation of the MRAM using memory cells for storing information by using a change in magnetoresistance of a magnetic tunnel junction (MTJ) element with a high S/N ratio. Each memory cell includes an MTJ element and a bipolar transistor. The read-out operation is carried out by selecting a word line, amplifying a current flowing in the MTJ element of a target memory cell by the bipolar transistor and outputting the amplified current to an associated read data line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.