Patent · US Expired

Memory circuit

US6580648B1 · kind B1 · utility

3Cited by
8References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 27, 2002
Grant dateJun 17, 2003
Priority date
Expiry dateMar 11, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/32
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a memory having sense amplifiers and data latches, the data latches being used in a test mode to form a signature register. In a normal operation mode, the data latches are form write data latches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.