William Barnes
32Patents
7h-index
4Co-inventors
58Inventor score
Filing activity: Apr 29, 1999 → Nov 19, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6598177B1 | Monitoring error conditions in an integrated circuit | Physics | 28 | Expired |
| US6622273B1 | Scan latch circuit | Physics | 23 | Expired |
| US6404229B1 | Complementary level shifting logic circuit with improved switching time | Electricity | 19 | Expired |
| US6362680B1 | Output circuit | Electricity | 14 | Expired |
| US6480050B1 | Level shifter with no quiescent DC current flow | Electricity | 14 | Expired |
| US6194956A | Low critical voltage current mirrors | Physics | 9 | Expired |
| US6369632B1 | CMOS switching circuitry | Electricity | 8 | Expired |
| US6420909B1 | Comparators | Electricity | 6 | Expired |
| US6525572B1 | Tristateable sense amplifier | Physics | 6 | Expired |
| US6268747A | Dynamic voltage sense amplifier | Physics | 4 | Expired |
| US6466083B1 | Current reference circuit with voltage offset circuitry | Physics | 4 | Expired |
| US6362991B1 | Miss detector | Physics | 4 | Expired |
| US7010732B2 | Built-in test support for an integrated circuit | Physics | 4 | Expired |
| US6163468A | Start up circuits and bias generators | Physics | 3 | Expired |
| USD791263S1 | Magazine accessory | General | 3 | Active |
| US6590428B2 | Evaluation of conduction at precharged node | Electricity | 3 | Expired |
| US6721193B2 | Cache memory | Physics | 3 | Expired |
| US6580648B1 | Memory circuit | Physics | 3 | Expired |
| US6580628B2 | Associative memory | Physics | 2 | Expired |
| US6417699B1 | Comparator circuits | Electricity | 2 | Expired |
| US9593902B2 | Systems and methods associated with a firearm sleeve | Mechanical Engineering; Lighting; Heating | 2 | Active |
| US6353365B1 | Current reference circuit | Physics | 2 | Expired |
| US6522164B2 | Switching circuit | Electricity | 2 | Expired |
| US6614701B2 | Weak bit testing | Physics | 2 | Expired |
| US6611929B1 | Test circuit for memory | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.