Patent · US Expired

System and method for monitoring and improving dimensional stability and registration accuracy of multi-layer PCB manufacture

US6581202B1 · kind B1 · utility

8Cited by
15References
70Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 2000
Grant dateJun 17, 2003
Priority date
Expiry dateJan 19, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K2203/056
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Targets are inserted throughout the layout of a PCB. Post manufacture measurement of the targets are compared to pre-manufacture positions so as to calculate a non-linear regression analysis best fit model. This model is used to predict a feature's location upon or within a PCB given the feature's position on the layout. The non-linear regression analysis results in a set of x and y polynomial equations. These polynomial equations allows for a linear compensation to be applied to the feature position on a layout so as to minimize misregistration of features in the manufacture of PCBs. Models of the features' post production positioning is made before and after linear compensations are made to the pre-manufacture positioning of the features. Graphical presentations using wire frame diagrams and color coded diagrams help identify those areas of the panel that are projected to be in and out of tolerance relative to the specifications.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.