Integrated circuit tester having a fail-safe mechanism for moving IC-chips
US6581486B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 11, 2001 |
| Grant date | Jun 24, 2003 |
| Priority date | — |
| Expiry date | Jan 4, 2022 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T74/18704
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit tester includes a fail-safe mechanism for moving an integrated circuit chip between an initial position where the integrated circuit chip is inserted into the tester, and a test position where the integrated circuit chips is actually tested. This fail-safe mechanism includes a motor and a shaft which the motor rotates to move the integrated circuit chip. An electronic control circuit can be included to automatically stop the motor when the integrated circuit reaches its initial position, or its test position; but if the control circuit fails to operate properly, then damage to the integrated circuit tester is prevented by the fail-safe mechanism.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.