Patent · US Expired

Lithographic apparatus, device manufacturing method, and device manufactured thereby

US6583855B2 · kind B2 · utility

22Cited by
7References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 3, 2001
Grant dateJun 24, 2003
Priority date
Expiry dateJul 3, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70191
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A lithographic projection system has an optical element provided in the illumination system for changing an elliptically symmetric intensity anomaly of the projection beam in a pupil of the projection apparatus, the optical element being rotated about the optical axis of the projection apparatus such that the change in intensity anomaly introduced by it counteracts an elliptically symmetric intensity anomaly present in the projection beam or introduced by another optical element traversed by the projection beam.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.