RF test set with concurrent measurement architecture
US6587671B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 1999 |
| Grant date | Jul 1, 2003 |
| Priority date | — |
| Expiry date | May 28, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W24/00
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.