Patent · US Expired

Method of fabricating a silicon-on-insulator system with thin semiconductor islets surrounded by an insulative material

US6593204B2 · kind B2 · utility

0Cited by
10References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 26, 2001
Grant dateJul 15, 2003
Priority date
Expiry dateJul 26, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76278
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of fabricating, from a first semiconductor substrate having two parallel main surfaces, a system including an islet of a semiconductor material surrounded by an insulative material and resting on another insulative material includes forming a layer of a first insulative material, and forming on the top main surface of the first semiconductor substrate a thin semiconductor layer forming the islet of semiconductor material. The thin semiconductor layer can be selectively etched relative to the first semiconductor substrate. A layer of a second insulative material is formed on exposed surfaces of the islet of semiconductor material and the thin semiconductor layer. The method further includes removing the first semiconductor substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.