Patent · US Expired

Method and device for on-chip decoupling capacitor using nanostructures as bottom electrode

US6599808B2 · kind B2 · utility

12Cited by
5References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 12, 2001
Grant dateJul 29, 2003
Priority date
Expiry dateSep 12, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/932
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Method for an on-chip decoupling capacitor. The capacitor includes a bottom electrode that consist of nanostructures deposited over a planarized metal, a dielectric material deposited over the nanostructures, and a top electrode deposited over the dielectric material. The shape of the bottom electrode is tunable by modulating the diameter and/or the length of the nanostructures to produce and increase in capacitance without increasing the footprint of the on-chip decoupling capacitor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.