Patent · US Expired

Method and apparatus for radio frequency (RF) metrology

US6608446B1 · kind B1 · utility

10Cited by
13References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 25, 2002
Grant dateAug 19, 2003
Priority date
Expiry dateFeb 25, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R19/0061
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A radio frequency (RF) probe head apparatus is provided for measuring voltage and current of an RF signal in a sampled transmission line. The probe head apparatus includes a conductive housing, a bus inside the conductive housing, a pair of connectors mounted on the conductive housing and configured to pass an RF signal into and out of the housing via the bus, a voltage pick-up board within the housing, and a current pickup board within the housing. The voltage pickup board has an analog processor responsive to an electric field around the bus to produce a first DC output indicative of a root-mean-square (RMS) value of the electric field. The current pick-up board has a second analog processor responsive to a magnetic field around the bus to produce a second DC output indicative of an RMS value of the magnetic field.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.