Apparatus and method concerning analysis and generation of part program for measuring coordinates and surface properties
US6611786B1 · kind B1 · utility
13Cited by
11References
14Claims
0Family size
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Key dates
| Filing date | Apr 20, 2000 |
| Grant date | Aug 26, 2003 |
| Priority date | — |
| Expiry date | Apr 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In coordinate and surface texture measurement in which measurement control is performed by a part program, a part program is analyzed to extract measurement information or measurement condition. The measurement condition is rewritably stored such that optimal measurement conditions of an actual measurement can be reflected in a part program, and such that the actual measurement conditions can be added to subsequent measurement control.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.