Patent · US Expired

Multiple stage deposition process for filling trenches

US6617224B2 · kind B2 · utility

5Cited by
20References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2001
Grant dateSep 9, 2003
Priority date
Expiry dateJun 28, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02274
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method of filling a trench in a substrate, a substrate is placed in a process zone, the substrate comprising a trench. A first deposition process is performed by providing a first gas into the process zone, maintaining first process conditions to deposit a first silicon oxide material in the trench in the substrate, and exhausting the first gas. Thereafter, a second deposition process is performed by providing a second gas into the process zone, maintaining second process conditions to deposit a second silicon oxide material to fill the trench and optionally overfill the trench, and exhausting the second gas. The multiple process deposition process allows the trench to be filled and overfilled with different types of silicon oxide materials to render the trench filling process more economical.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.