Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector
US6623161B2 · kind B2 · utility
6Cited by
19References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2001 |
| Grant date | Sep 23, 2003 |
| Priority date | — |
| Expiry date | Sep 2, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/5258
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for identifying detector elements in a solid state X-ray detector susceptible to causing line artifacts due to faulty detector elements that leak charge. A portion of the X-ray detector is covered by a radiation occluding material and the detector is exposed to a level of radiation sufficient to reach a predetermined threshold in the exposed portion of the detector. An image representative of the radiation is acquired and further analyzed to determine whether line artifacts exist. Data lines found to exhibit line artifacts are stored in the image processor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.