Patent · US Expired

Tool to reconfigure pin connections between a DUT and a tester

US6625771B2 · kind B2 · utility

2Cited by
7References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 22, 2001
Grant dateSep 23, 2003
Priority date
Expiry dateMay 3, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31926
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improved method of simulating the testing of integrated circuits is provided. A database of desired connections between a tester unit and a DUT for different downbonds is accessed by a multiplexer which sets up the desired connections. The system automatically makes the correct connection for each downbond without manual intervention from the user as was required in traditional simulator systems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.