Patent · US Expired

Method of analyzing integrated circuit power distribution in chips containing voltage islands

US6631502B2 · kind B2 · utility

48Cited by
6References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 16, 2002
Grant dateOct 7, 2003
Priority date
Expiry dateJan 16, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of analyzing the power distribution in a chip containing one or more voltage islands, each voltage island having a power distribution network connected to a chip-level power distribution network by one or more voltage translation interface circuits. The method comprising: analyzing the voltage-island power distribution networks independently of the chip-level power distribution network to obtain voltage translation interface circuit currents; using the voltage translation interface circuit currents as input to a model of the chip-level power distribution network to obtain voltage translation interface circuit input voltages; and calculating voltage translation interface circuit output voltages based on the voltage translation interface circuit input voltages, the voltage translation interface circuit currents, and current-voltage characteristics of the voltage translation interface circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.