Dark view inspection system for transparent media
US6633377B1 · kind B1 · utility
68Cited by
10References
57Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 20, 2000 |
| Grant date | Oct 14, 2003 |
| Priority date | — |
| Expiry date | Apr 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/958
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and a method for the detection and identification of light diverting and transparent defects with optical properties in a transparent medium. The apparatus has a light source with an aperture stop, a lens system focusing an image of the aperture stop at a plane, and means to pass the transparent medium through said column of light. The apparatus and method provide dark view images of the defects. The apparatus and method may be combined with a viewing area inspection system. The transparent medium may be curved, and especially face plates for cathode ray tubes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.