Image Processing Systems Inc.
6Patents
0Active
6Granted
28Portfolio score
Filing activity: Jun 26, 1996 → Apr 20, 2000
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6633377B1 | Dark view inspection system for transparent media | Physics | 68 | Expired |
| US5969756A | Test and alignment system for electronic display devices and test fixture for same | Electricity | 44 | Expired |
| US6448549B1 | Bottle thread inspection system and method of operating the same | Physics | 30 | Expired |
| US6252626A | Test and alignment system for electronic display devices | Electricity | 12 | Expired |
| US6058221A | Electron beam profile measurement method and system | Electricity | 3 | Expired |
| US6097355A | Purity/beam landing error measurement method for electronic display devices | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.