Patent · US Expired

Systems and methods using sequential lateral solidification for producing single or polycrystalline silicon thin films at low temperatures

US6635554B1 · kind B1 · utility

73Cited by
7References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 23, 2001
Grant dateOct 21, 2003
Priority date
Expiry dateMar 23, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02691
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

System and methods for processing an amorphous silicon thin film sample into a single or polycrystalline silicon thin film are disclosed. The system includes an excimer laser for generating a plurality of excimer laser pulses of a predetermined fluence, an energy density modulator for controllably modulating fluence of the excimer laser pulses, a beam homoginizer for homoginizing modulated laser pulses in a predetermined plane, a mask for masking portions of the homoginized modulated laser pulses into patterned beamlets, a sample stage for receiving the patterned beamlets to effect melting of portions of any amorphous silicon thin film sample placed thereon corresponding to the beamlets, translating means for controllably translating a relative position of the sample stage with respect to a position of the mask and a computer for controlling the controllable fluence modulation of the excimer laser pulses and the controllable relative positions of the sample stage and mask, and for coordinating excimer pulse generation and fluence modulation with the relative positions of the sample stage and mask, to thereby process amorphous silicon thin film sample into a single or polycrystallin…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.