Method and apparatus for configurable hardware augmented program generation
US6636061B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 10, 2002 |
| Grant date | Oct 21, 2003 |
| Priority date | — |
| Expiry date | Jul 10, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07371
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are disclosed for enabling reconfiguration of a test system. The test system includes an adapter assembly and a tester electronics assembly. The adapter assembly includes two probe plates, which hold a probe field. The two probe plates include a plurality of holes extending through each probe plate. Each hole includes a flange area for accommodating deflection of the probes, inserted in the holes extending through the probe plates. The flange area and the use of flexible probes facilitate a deflection and an offset of the probes in the probe plates. A tester assembly includes a plurality of wear pads on the topside of a printed circuit board. The wear pads positioned to engage the bottom end of the probes. Configurable logic elements located on the underside of the printed circuit board are used to generating and receive test-signals, depending on where the probes make contact with the wear pads on the printed circuit board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.