Patent · US Expired

Ultrasonic flaw detection method and apparatus

US6640632B1 · kind B1 · utility

24Cited by
10References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2002
Grant dateNov 4, 2003
Priority date
Expiry dateApr 30, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/2675
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In the ultrasonic flaw detection method and apparatus, wideband longitudinal ultrasonic waves are irradiated from an ultrasonic wave generator probe onto a weld portion of a coarse grained material; from the waveforms of flaw detection echoes that are subsequently obtained, the highest frequency component that can be extracted using time frequency analysis is then extracted; subsequent ½ magnification frequency components are then extracted sequentially; waveforms of a necessary plurality of frequency bands from among each of the frequency bands that were extracted and have undergone waveform separation are then multiplied, and waveform peaks that are formed by the multiplication are detected as being defect portion echoes generated by defect portions in the coarse grained material weld portion; and, as a result, information on the defect portion is obtained from the detected defect portion echo.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.