Patent · US Expired

Barrier material encapsulation of programmable material

US6642102B2 · kind B2 · utility

165Cited by
20References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 30, 2001
Grant dateNov 4, 2003
Priority date
Expiry dateJun 30, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/90
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method comprising forming as stacked materials on a substrate, a volume of programmable material and a signal line, conformably forming a first dielectric material on the stacked materials, forming a second dielectric material on the first material, etching an opening in the second dielectric material with an etchant that, between the first dielectric material and the second dielectric material, favors removal of the second dielectric material, and forming a contact in the opening to the stacked materials. An apparatus comprising a contact point formed on a substrate, a volume of programmable material formed on the contact point, a signal line formed on the volume of programmable material, a first dielectric material conformally formed on the signal line, a different second dielectric material formed on the first dielectric material, and a contact formed through the first dielectric material and the second dielectric material to the signal line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.