Tunable analog to digital converter
US6642880B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 31, 2002 |
| Grant date | Nov 4, 2003 |
| Priority date | — |
| Expiry date | Jul 31, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/18
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A tunable analog-to-digital converter which generates samples having M-bits for use with an operating circuit. The operating circuit generates a first enable signal to instruct the analog-to-digital converter to turn on. Additionally, a sensor generates an analog signal in response to a condition. The tunable analog-to-digital converter includes a primary analog-to-digital converter which receives the analog signal and converts the analog signal to a primary digital signal upon receipt of the first enable signal. The tunable analog-to-digital converter also includes a comparator and a secondary analog-to-digital converter. The comparator compares the value of the primary digital signal to a predetermined value and generates a second enable signal depending on the value of the primary digital signal and the predetermined value. The secondary analog-to-digital converter receives the analog signal and converts the analog signal to a secondary digital signal upon receipt of the second enable signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.