Patent · US Expired

Variable level memory

US6643169B2 · kind B2 · utility

82Cited by
6References
56Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2001
Grant dateNov 4, 2003
Priority date
Expiry dateSep 18, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5641
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

There exists a tradeoff between the fidelity of data storage and the number of bits stored in a memory cell. The number of bits may be increased per cell when fidelity is less important. The number of bits per cell may be decreased when fidelity is more important. A memory, in some embodiments, may change between storage modes on a cell by cell basis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.