Touch signal probe and signal processing apparatus and signal processing method of the same
US6643944B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 30, 2002 |
| Grant date | Nov 11, 2003 |
| Priority date | — |
| Expiry date | May 30, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A touch signal probe comprises a fixed member, a movable member, a bias means, a drive member, a deformation touch signal processing circuit, a contact touch signal processing circuit, and a latch circuit. A stylus is attached to the movable member. The drive member relatively drives reseat position elements respectively placed on the fixed member and the movable member. The bias means restores the movable member to a still position. The deformation touch signal processing circuit generates a deformation touch signal. The contact touch signal processing circuit uses the reseat position elements as make-and-break electric contacts to generate a contact touch signal. The latch circuit inputs coordinate values every instant at which the deformation touch signal is output and stores the coordinate values as the most recent coordinate values for update, and when the contact touch signal is output, outputs the most recent coordinate values as detected coordinate values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.