Patent · US Expired

Method and apparatus to reduce the amount of redundant memory column and fuses associated with a memory device

US6646933B1 · kind B1 · utility

4Cited by
11References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 2002
Grant dateNov 11, 2003
Priority date
Expiry dateJul 31, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/808
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method, system, and apparatus exist which couple a first group of non-redundant memory columns to a non-redundant input-output circuit and couple a second group of redundant memory columns to a redundant input-output circuit. A fewer amount of memory columns exist in the second group of redundant memory columns than in the first of non-redundant memory columns. A first fuse indicates whether one or more memory columns are defective in a group of non-redundant memory columns coupled to the non-redundant input output circuit. Also, a second fuse couples to a first circuit. The first circuit identifies which sub-input circuit is coupled to the one or more defective memory columns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.