Method for reducing design effect of wearout mechanisms on signal skew in integrated circuit design
US6651230B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2001 |
| Grant date | Nov 18, 2003 |
| Priority date | — |
| Expiry date | Jan 28, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F1/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for reducing the effect of signal skew degradation in the design of an integrated circuit is provided. First, a circuit design library is created describing library cells as a function of one or more environmental variable, wherein the one or more environmental variable includes a skew degradation variable indicating skew degradation of a signal as a function of a total number of signal switches of the signal. Then, the integrated circuit design is modeled utilizing the circuit design library to determine a first skew degradation for each of the first and second signals at a first predetermined number of signal switches, and a second skew degradation for each of the first and second signals for a second predetermined number of signal switches, and further to determine a first relative skew degradation for a first predetermined number of signal switches and a second relative skew degradation for a second predetermined number of signal switches, wherein a relative skew degradation is equal to the difference of the skew degradation of the first signal and the skew degradation of the second signal for a given number of signal switches. Next, a skew shift equal to the differenc…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.