Patent · US Expired

Optical measurement and inspection method and apparatus having enhanced optical path difference detection

US6653649B2 · kind B2 · utility

7Cited by
4References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 20, 2001
Grant dateNov 25, 2003
Priority date
Expiry dateDec 11, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/25
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An optical measurement and inspection method and apparatus having enhanced path length detection uses a Fabry-Perot cavity to increase the phase detection sensitivity for light reflected from optical structures within a device under inspection. A partially reflective surface is inserted between an illumination subsystem and the device under inspection and the position of the partially reflective surface may be adjusted by a positioner to create the Fabry-Perot cavity between one or more surfaces within the device under inspection. The detection of phase changes is improved, providing improved sensitivity to optical path differences produced by structures within the device under inspection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.