Beyond 3, Inc.
6Patents
0Active
6Granted
28Portfolio score
Filing activity: May 30, 2001 → Jan 2, 2004
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6778307B2 | Method and system for performing swept-wavelength measurements within an optical system | Physics | 71 | Expired |
| US6879421B2 | Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator | Physics | 20 | Expired |
| US6717707B2 | Method and system for controlling resonance within a resonator-enhanced optical system | Physics | 15 | Expired |
| US6653649B2 | Optical measurement and inspection method and apparatus having enhanced optical path difference detection | Physics | 7 | Expired |
| US6700840B2 | Optical storage method and apparatus having enhanced resolution | Physics | 7 | Expired |
| US6714295B2 | Optical inspection method and apparatus having an enhanced height sensitivity region and roughness filtering | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.