Patent · US Expired

Semiconductor device manufacturing apparatus having rotatable gas injector and thin film deposition method using the same

US6656284B1 · kind B1 · utility

15Cited by
10References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2002
Grant dateDec 2, 2003
Priority date
Expiry dateJun 28, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24273
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Disclosed is a semiconductor device manufacturing apparatus provided with a rotational gas injector for supplying source gases at an upper portion of a reaction chamber. According to the invention, source gases are injected from the upside of the wafers through the rotational type gas injector, and non-reacted gases are exhausted into the downside space of the wafers, so that lowering in the thickness uniformity of a thin film due to the horizontal flow of source gases provided in the conventional art decrease remarkably. Accordingly, although multiple wafers are loaded in a single reaction chamber, a thin film having very high thickness uniformity can be deposited with respect to all the wafers, thereby capable of enhancing the productivity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.