Surface mount probe point socket and system
US6659812B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 19, 2002 |
| Grant date | Dec 9, 2003 |
| Priority date | — |
| Expiry date | Jun 19, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2818
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A surface mount probe point socket has a housing with base and a socket extending from the base. The base has a length and width sufficient for attaching the housing to a circuit trace using an electrically conductive material while adding minimal inductance and capacitance to the circuit trace. The socket has a height and diameter for supporting a measurement probe in the housing while adding minimal inductance and capacitance to the measurement probe. A probe point contact is disposed in the bore of the socket for receiving a probe point disposed in the end of the measurement probe to secure the probe in the housing. Two surface mount probe point sockets may be joined together with an alignment gage and attached to adjacent circuit traces to produce a surface mount probe point socket system for differential measurement probes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.